A sequential k-nearest neighbor classification approach for data-driven fault diagnosis using distance- and density-based affinity measures

M. Pecht, M. Kang, G.K. Ramaswami, Melinda Hodkiewicz, Edward Cripps, J.M. Kim

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

© Springer International Publishing Switzerland 2016.Machine learning techniques are indispensable in today’s data-driven fault diagnosis methodolgoies. Among many machine techniques, k-nearest neighbor (k-NN) is one of the most widely used for fault diagnosis due to its simplicity, effectiveness, and computational efficiency. However, the lack of a density-based affinity measure in the conventional k-NN algorithm can decrease the classification accuracy. To address this issue, a sequential k-NN classification methodology using distance- and density-based affinity measures in a sequential manner is introduced for classification.
Original languageEnglish
Pages (from-to)253-261
Number of pages9
JournalLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume9714
DOIs
Publication statusPublished - 2016

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