TY - JOUR
T1 - A sequential k-nearest neighbor classification approach for data-driven fault diagnosis using distance- and density-based affinity measures
AU - Pecht, M.
AU - Kang, M.
AU - Ramaswami, G.K.
AU - Hodkiewicz, Melinda
AU - Cripps, Edward
AU - Kim, J.M.
PY - 2016
Y1 - 2016
N2 - © Springer International Publishing Switzerland 2016.Machine learning techniques are indispensable in today’s data-driven fault diagnosis methodolgoies. Among many machine techniques, k-nearest neighbor (k-NN) is one of the most widely used for fault diagnosis due to its simplicity, effectiveness, and computational efficiency. However, the lack of a density-based affinity measure in the conventional k-NN algorithm can decrease the classification accuracy. To address this issue, a sequential k-NN classification methodology using distance- and density-based affinity measures in a sequential manner is introduced for classification.
AB - © Springer International Publishing Switzerland 2016.Machine learning techniques are indispensable in today’s data-driven fault diagnosis methodolgoies. Among many machine techniques, k-nearest neighbor (k-NN) is one of the most widely used for fault diagnosis due to its simplicity, effectiveness, and computational efficiency. However, the lack of a density-based affinity measure in the conventional k-NN algorithm can decrease the classification accuracy. To address this issue, a sequential k-NN classification methodology using distance- and density-based affinity measures in a sequential manner is introduced for classification.
UR - http://www.scopus.com/inward/record.url?scp= 85008514401&partnerID=8YFLogxK
U2 - 10.1007/978-3-319-40973-3_25
DO - 10.1007/978-3-319-40973-3_25
M3 - Article
VL - 9714
SP - 253
EP - 261
JO - Lecture Notes in Computer Science
JF - Lecture Notes in Computer Science
SN - 0302-9743
ER -