A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM)

Brendan Griffin, A. Van Riessen, L.M. Egerton-Warburton, J. Hatch, R.M. Trautman

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationMicrobeam Analysis
Place of PublicationNew York
PublisherWiley-VCH Verlag GmbH & Co. KGaA
Pages245-245
Publication statusPublished - 1994
EventA review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM) -
Duration: 1 Jan 1994 → …

Conference

ConferenceA review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM)
Period1/01/94 → …

Cite this

Griffin, B., Van Riessen, A., Egerton-Warburton, L. M., Hatch, J., & Trautman, R. M. (1994). A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM). In Microbeam Analysis (pp. 245-245). New York: Wiley-VCH Verlag GmbH & Co. KGaA.
Griffin, Brendan ; Van Riessen, A. ; Egerton-Warburton, L.M. ; Hatch, J. ; Trautman, R.M. / A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM). Microbeam Analysis. New York : Wiley-VCH Verlag GmbH & Co. KGaA, 1994. pp. 245-245
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pages = "245--245",
booktitle = "Microbeam Analysis",
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Griffin, B, Van Riessen, A, Egerton-Warburton, LM, Hatch, J & Trautman, RM 1994, A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM). in Microbeam Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, New York, pp. 245-245, A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM), 1/01/94.

A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM). / Griffin, Brendan; Van Riessen, A.; Egerton-Warburton, L.M.; Hatch, J.; Trautman, R.M.

Microbeam Analysis. New York : Wiley-VCH Verlag GmbH & Co. KGaA, 1994. p. 245-245.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM)

AU - Griffin, Brendan

AU - Van Riessen, A.

AU - Egerton-Warburton, L.M.

AU - Hatch, J.

AU - Trautman, R.M.

PY - 1994

Y1 - 1994

M3 - Conference paper

SP - 245

EP - 245

BT - Microbeam Analysis

PB - Wiley-VCH Verlag GmbH & Co. KGaA

CY - New York

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Griffin B, Van Riessen A, Egerton-Warburton LM, Hatch J, Trautman RM. A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM). In Microbeam Analysis. New York: Wiley-VCH Verlag GmbH & Co. KGaA. 1994. p. 245-245