@inproceedings{b7faa66a6c7c46418f9a380c50fdb8c4,
title = "A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM)",
author = "Brendan Griffin and {Van Riessen}, A. and L.M. Egerton-Warburton and J. Hatch and R.M. Trautman",
year = "1994",
language = "English",
pages = "245--245",
booktitle = "Microbeam Analysis",
publisher = "Wiley-VCH Verlag GmbH & Co. KGaA",
address = "Germany",
note = "A review of EDS x-ray microanalysis and element mapping in high pressure DEM (ESEM) ; Conference date: 01-01-1994",
}