A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System

Brendan Griffin, Alexandra Suvorova

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationTopical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis
EditorsR. Gauvin, D. Joy, J. Small, A. Armiglitato, F. Grillon
Place of PublicationQuebec, Canada
PublisherMSA-MAS-MSC/SMC and EMAS
Pagesnone in publication
Volumeone
EditionMontreal, Quebec, Canada
Publication statusPublished - 2002
EventA Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System - Montreal, Quebec, Canada
Duration: 1 Jan 2002 → …

Conference

ConferenceA Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System
Period1/01/02 → …

Cite this

Griffin, B., & Suvorova, A. (2002). A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System. In R. Gauvin, D. Joy, J. Small, A. Armiglitato, & F. Grillon (Eds.), Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis (Montreal, Quebec, Canada ed., Vol. one, pp. none in publication). MSA-MAS-MSC/SMC and EMAS.