A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System

Brendan Griffin; Alexandra Suvorova

A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis
Editors	R. Gauvin, D. Joy, J. Small, A. Armiglitato, F. Grillon
Place of Publication	Quebec, Canada
Publisher	MSA-MAS-MSC/SMC and EMAS
Pages	none in publication
Volume	one
Edition	Montreal, Quebec, Canada
Publication status	Published - 2002
Event	A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System - Montreal, Quebec, Canada Duration: 1 Jan 2002 → …

Conference

Conference	A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System
Period	1/01/02 → …

Cite this

Griffin, B., & Suvorova, A. (2002). A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System. In R. Gauvin, D. Joy, J. Small, A. Armiglitato, & F. Grillon (Eds.), Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis (Montreal, Quebec, Canada ed., Vol. one, pp. none in publication). MSA-MAS-MSC/SMC and EMAS.

Griffin, Brendan ; Suvorova, Alexandra. / A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System. Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis. editor / R. Gauvin ; D. Joy ; J. Small ; A. Armiglitato ; F. Grillon. Vol. one Montreal, Quebec, Canada. ed. Quebec, Canada : MSA-MAS-MSC/SMC and EMAS, 2002. pp. none in publication

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title = "A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System",

author = "Brendan Griffin and Alexandra Suvorova",

year = "2002",

language = "English",

volume = "one",

pages = "none in publication",

editor = "R. Gauvin and D. Joy and J. Small and A. Armiglitato and F. Grillon",

booktitle = "Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis",

publisher = "MSA-MAS-MSC/SMC and EMAS",

edition = "Montreal, Quebec, Canada",

note = "A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System ; Conference date: 01-01-2002",

}

Griffin, B & Suvorova, A 2002, A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System. in R Gauvin, D Joy, J Small, A Armiglitato & F Grillon (eds), Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis. Montreal, Quebec, Canada edn, vol. one, MSA-MAS-MSC/SMC and EMAS, Quebec, Canada, pp. none in publication, A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System, 1/01/02.

A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System. / Griffin, Brendan; Suvorova, Alexandra.
Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis. ed. / R. Gauvin; D. Joy; J. Small; A. Armiglitato; F. Grillon. Vol. one Montreal, Quebec, Canada. ed. Quebec, Canada: MSA-MAS-MSC/SMC and EMAS, 2002. p. none in publication.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System

AU - Griffin, Brendan

AU - Suvorova, Alexandra

PY - 2002

Y1 - 2002

M3 - Conference paper

VL - one

SP - none in publication

BT - Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis

A2 - Gauvin, R.

A2 - Joy, D.

A2 - Small, J.

A2 - Armiglitato, A.

A2 - Grillon, F.

PB - MSA-MAS-MSC/SMC and EMAS

CY - Quebec, Canada

T2 - A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System

Y2 - 1 January 2002

ER -

Griffin B, Suvorova A. A Review of Charge-related Contrasts observed in Variable Pressure SEM using a Biased Electron Detector System. In Gauvin R, Joy D, Small J, Armiglitato A, Grillon F, editors, Topical Conference of Characterization of Non-Conductive or Charging Materials with Microbeam Analysis. Montreal, Quebec, Canada ed. Vol. one. Quebec, Canada: MSA-MAS-MSC/SMC and EMAS. 2002. p. none in publication