A physical large-signal model for GaN HEMTS including self-heating and trap-related dispersion

D. Mari, M. Bernardoni, G. Sozzi, R. Menozzi, Gilberto A. Umana Membreno, Brett Nener

Research output: Contribution to journalArticle

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)229-234
JournalMicroelectronics Reliability
Volume51
DOIs
Publication statusPublished - 2011

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