A new F(ast)-CMS NEGF algorithm for efficient 3D simulations of switching characteristics enhancement in constricted tunnel barrier silicon nanowire MuGFETs

Aryan Afzalian, Nima Dehdashti Akhavan, Chi-Woo Lee, Ran Yan, Isabelle Ferain, Pedram Razavi, Jean-Pierre Colinge

Research output: Contribution to journalArticlepeer-review

37 Citations (Scopus)

Abstract

In this paper, we present 3D quantum simulations based on Non-Equilibrium Green's Function (NEGF) formalism using the Comsol Multiphysics (TM) software and on the implementation of a new Fast Coupled Mode-Space (FCMS) approach. The FCMS algorithm allows one to simulate transport in nanostructures presenting discontinuities, as the normal Coupled Mode-Space (CMS) algorithm does, but with the speed of a Fast Uncoupled-Mode Space (FUMS) algorithm (a faster algorithm that cannot handle discontinuities). We then use this new algorithm to explore the effect of local constrictions on the performance of nanowire MultiGate Field-Effect Transistors (MuGFETs). We show that cross-section variations in a nanowire result in the formation of energy barriers that can be used to improve the on/off current ratio and switching characteristics of transistors: (1) A small constriction resulting in a barrier of the order of a 0.1 eV can be used as an effective means to improve the subthreshold slope and minimize the on/off current ratio degradation resulting from SD tunneling in ultra scaled transistor, and (2) We also report a new variable barrier transistor (VBT) device concept that is able to achieve sub-kT/q subthreshold slope without using impact ionization or band-to-band tunneling. Intra-band tunneling through constriction barriers is used instead. The device is, therefore, fully symmetrical and can operate at very low supply voltages. A subthreshold slope as low as 56.5 mV/decade is reported at T = 300 K. The VBT reported here breaks the 60 mV/dec barrier over more than five decades of subthreshold current, which is the widest current range reported so far.

Original languageEnglish
Pages (from-to)287-306
Number of pages20
JournalJournal of Computational Electronics
Volume8
Issue number3-4
DOIs
Publication statusPublished - Oct 2009

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