A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures

J.F. Siliquini; M.G. Xu; John Dell

A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures

J.F. Siliquini, M.G. Xu, John Dell

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Technical Digest - Symposium on Optical Fibre Measurements, 1996
Editors	G.W. Day, D.L. Franzen, P.A. Williams
Place of Publication	Boulder, CO, USA
Publisher	National Institute Standards and Technology
Pages	35-38
Volume	905
Edition	Boulder, CO, USA
Publication status	Published - 1996
Event	A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures - Boulder, CO, USA Duration: 1 Jan 1996 → …

Conference

Conference	A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures
Period	1/01/96 → …

Cite this

Siliquini, J. F., Xu, M. G., & Dell, J. (1996). A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. In G. W. Day, D. L. Franzen, & P. A. Williams (Eds.), Technical Digest - Symposium on Optical Fibre Measurements, 1996 (Boulder, CO, USA ed., Vol. 905, pp. 35-38). National Institute Standards and Technology.

Siliquini, J.F. ; Xu, M.G. ; Dell, John. / A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. Technical Digest - Symposium on Optical Fibre Measurements, 1996. editor / G.W. Day ; D.L. Franzen ; P.A. Williams. Vol. 905 Boulder, CO, USA. ed. Boulder, CO, USA : National Institute Standards and Technology, 1996. pp. 35-38

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title = "A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures",

author = "J.F. Siliquini and M.G. Xu and John Dell",

year = "1996",

language = "English",

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pages = "35--38",

editor = "G.W. Day and D.L. Franzen and P.A. Williams",

booktitle = "Technical Digest - Symposium on Optical Fibre Measurements, 1996",

publisher = "National Institute Standards and Technology",

edition = "Boulder, CO, USA",

note = "A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures ; Conference date: 01-01-1996",

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Siliquini, JF, Xu, MG & Dell, J 1996, A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. in GW Day, DL Franzen & PA Williams (eds), Technical Digest - Symposium on Optical Fibre Measurements, 1996. Boulder, CO, USA edn, vol. 905, National Institute Standards and Technology, Boulder, CO, USA, pp. 35-38, A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures, 1/01/96.

A General Method of Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. / Siliquini, J.F.; Xu, M.G.; Dell, John.
Technical Digest - Symposium on Optical Fibre Measurements, 1996. ed. / G.W. Day; D.L. Franzen; P.A. Williams. Vol. 905 Boulder, CO, USA. ed. Boulder, CO, USA: National Institute Standards and Technology, 1996. p. 35-38.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

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AU - Dell, John

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PB - National Institute Standards and Technology

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