A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures

J.F. Siliquini; M.G. Xu; John Dell

A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures

J.F. Siliquini, M.G. Xu, John Dell

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Technical Digest Symposium on Optical Fiber Measurements, 1996
Editors	G.W. Dau, D.L. Franzen, P.A. Williams
Place of Publication	Washington, D.C. USA
Publisher	National Institute of Standards and Technology
Pages	35-38
Volume	1
Edition	Boulder, Colorado, USA
Publication status	Published - 1997
Event	A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures - Boulder, Colorado, USA Duration: 1 Jan 1997 → …

Conference

Conference	A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures
Period	1/01/97 → …

Cite this

Siliquini, J. F., Xu, M. G., & Dell, J. (1997). A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. In G. W. Dau, D. L. Franzen, & P. A. Williams (Eds.), Technical Digest Symposium on Optical Fiber Measurements, 1996 (Boulder, Colorado, USA ed., Vol. 1, pp. 35-38). National Institute of Standards and Technology.

Siliquini, J.F. ; Xu, M.G. ; Dell, John. / A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. Technical Digest Symposium on Optical Fiber Measurements, 1996. editor / G.W. Dau ; D.L. Franzen ; P.A. Williams. Vol. 1 Boulder, Colorado, USA. ed. Washington, D.C. USA : National Institute of Standards and Technology, 1997. pp. 35-38

@inproceedings{0fff0e28e0434dd1b209a3cec8a410be,

title = "A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures",

author = "J.F. Siliquini and M.G. Xu and John Dell",

year = "1997",

language = "English",

volume = "1",

pages = "35--38",

editor = "G.W. Dau and D.L. Franzen and P.A. Williams",

booktitle = "Technical Digest Symposium on Optical Fiber Measurements, 1996",

publisher = "National Institute of Standards and Technology",

edition = "Boulder, Colorado, USA",

note = "A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures ; Conference date: 01-01-1997",

}

Siliquini, JF, Xu, MG & Dell, J 1997, A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. in GW Dau, DL Franzen & PA Williams (eds), Technical Digest Symposium on Optical Fiber Measurements, 1996. Boulder, Colorado, USA edn, vol. 1, National Institute of Standards and Technology, Washington, D.C. USA, pp. 35-38, A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures, 1/01/97.

A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. / Siliquini, J.F.; Xu, M.G.; Dell, John.
Technical Digest Symposium on Optical Fiber Measurements, 1996. ed. / G.W. Dau; D.L. Franzen; P.A. Williams. Vol. 1 Boulder, Colorado, USA. ed. Washington, D.C. USA: National Institute of Standards and Technology, 1997. p. 35-38.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures

AU - Siliquini, J.F.

AU - Xu, M.G.

AU - Dell, John

PY - 1997

Y1 - 1997

M3 - Conference paper

VL - 1

SP - 35

EP - 38

BT - Technical Digest Symposium on Optical Fiber Measurements, 1996

A2 - Dau, G.W.

A2 - Franzen, D.L.

A2 - Williams, P.A.

PB - National Institute of Standards and Technology

CY - Washington, D.C. USA

T2 - A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures

Y2 - 1 January 1997

ER -

Siliquini JF, Xu MG, Dell J. A General Method for Measuring the Electric-Field-Dependent Absorption Coefficient in Quantum Confined Structures. In Dau GW, Franzen DL, Williams PA, editors, Technical Digest Symposium on Optical Fiber Measurements, 1996. Boulder, Colorado, USA ed. Vol. 1. Washington, D.C. USA: National Institute of Standards and Technology. 1997. p. 35-38