A convergent beam electron diffraction study of CuAgS

A. W. S. Johnson, Christopher Baker, Frank John Lincoln

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationElectron Microscopy 1990
Subtitle of host publicationProceedings of the 12th International Congress for Electron Microscopy (Seattle, Washington, USA 12-18 August 1990)
EditorsL. D. Peachey, D. B. Williams
Place of PublicationUSA
Pages484
Publication statusPublished - 1990
Event12th International Congress for Electron Microscopy - Seattle, United States
Duration: 12 Aug 199018 Aug 1990

Other

Other12th International Congress for Electron Microscopy
CountryUnited States
CitySeattle
Period12/08/9018/08/90

Cite this

Johnson, A. W. S., Baker, C., & Lincoln, F. J. (1990). A convergent beam electron diffraction study of CuAgS. In L. D. Peachey, & D. B. Williams (Eds.), Electron Microscopy 1990: Proceedings of the 12th International Congress for Electron Microscopy (Seattle, Washington, USA 12-18 August 1990) (pp. 484).