A convergent beam electron diffraction study of CuAgS

A. W. S.  Johnson; Christopher Baker; Frank John Lincoln

A convergent beam electron diffraction study of CuAgS

A. W. S. Johnson, Christopher Baker, Frank John Lincoln

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Electron Microscopy 1990
Subtitle of host publication	Proceedings of the 12th International Congress for Electron Microscopy (Seattle, Washington, USA 12-18 August 1990)
Editors	L. D. Peachey, D. B. Williams
Place of Publication	USA
Pages	484
Publication status	Published - 1990
Event	12th International Congress for Electron Microscopy - Seattle, United States Duration: 12 Aug 1990 → 18 Aug 1990

Other

Other	12th International Congress for Electron Microscopy
Country/Territory	United States
City	Seattle
Period	12/08/90 → 18/08/90

Cite this

@inproceedings{4524521cc4994d208f745abae79bca1f,

title = "A convergent beam electron diffraction study of CuAgS",

author = "Johnson, {A. W. S.} and Christopher Baker and Lincoln, {Frank John}",

year = "1990",

language = "English",

pages = "484",

editor = "Peachey, {L. D.} and Williams, {D. B.}",

booktitle = "Electron Microscopy 1990",

note = "12th International Congress for Electron Microscopy ; Conference date: 12-08-1990 Through 18-08-1990",

}

Johnson, AWS, Baker, C & Lincoln, FJ 1990, A convergent beam electron diffraction study of CuAgS. in LD Peachey & DB Williams (eds), Electron Microscopy 1990: Proceedings of the 12th International Congress for Electron Microscopy (Seattle, Washington, USA 12-18 August 1990). USA, pp. 484, 12th International Congress for Electron Microscopy, Seattle, Washington, United States, 12/08/90.

A convergent beam electron diffraction study of CuAgS. / Johnson, A. W. S. ; Baker, Christopher; Lincoln, Frank John.
Electron Microscopy 1990: Proceedings of the 12th International Congress for Electron Microscopy (Seattle, Washington, USA 12-18 August 1990). ed. / L. D. Peachey; D. B. Williams. USA, 1990. p. 484.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - A convergent beam electron diffraction study of CuAgS

AU - Johnson, A. W. S.

AU - Baker, Christopher

AU - Lincoln, Frank John

PY - 1990

Y1 - 1990

M3 - Conference paper

SP - 484

BT - Electron Microscopy 1990

A2 - Peachey, L. D.

A2 - Williams, D. B.

CY - USA

T2 - 12th International Congress for Electron Microscopy

Y2 - 12 August 1990 through 18 August 1990

ER -