A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles

Brendan Griffin

A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles

Brendan Griffin

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	8th Asia-Pacific Conference on Electron Microscopy
Editors	Japanese Society Of Microscopy
Place of Publication	Japan
Publisher	Kanazawa Medical University
Pages	25
Volume	0
Edition	Kanazawa, Japan
Publication status	Published - 2004
Event	A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles - Kanazawa, Japan Duration: 1 Jan 2004 → …

Conference

Conference	A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles
Period	1/01/04 → …

Cite this

Griffin, Brendan. / A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles. 8th Asia-Pacific Conference on Electron Microscopy. editor / Japanese Society Of Microscopy. Vol. 0 Kanazawa, Japan. ed. Japan : Kanazawa Medical University, 2004. pp. 25

@inproceedings{332ce347cd30482eb9fe639e8ccb45ab,

title = "A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles",

author = "Brendan Griffin",

year = "2004",

language = "English",

volume = "0",

pages = "25",

editor = "Microscopy, {Japanese Society Of}",

booktitle = "8th Asia-Pacific Conference on Electron Microscopy",

publisher = "Kanazawa Medical University",

edition = "Kanazawa, Japan",

note = "A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles ; Conference date: 01-01-2004",

}

Griffin, B 2004, A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles. in JSO Microscopy (ed.), 8th Asia-Pacific Conference on Electron Microscopy. Kanazawa, Japan edn, vol. 0, Kanazawa Medical University, Japan, pp. 25, A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles, 1/01/04.

A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles. / Griffin, Brendan.

8th Asia-Pacific Conference on Electron Microscopy. ed. / Japanese Society Of Microscopy. Vol. 0 Kanazawa, Japan. ed. Japan : Kanazawa Medical University, 2004. p. 25.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles

AU - Griffin, Brendan

PY - 2004

Y1 - 2004

M3 - Conference paper

VL - 0

SP - 25

BT - 8th Asia-Pacific Conference on Electron Microscopy

A2 - Microscopy, Japanese Society Of

PB - Kanazawa Medical University

CY - Japan

T2 - A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles

Y2 - 1 January 2004

ER -