A comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles

Brendan Griffin

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publication8th Asia-Pacific Conference on Electron Microscopy
EditorsJapanese Society Of Microscopy
Place of PublicationJapan
PublisherKanazawa Medical University
Pages25
Volume0
EditionKanazawa, Japan
Publication statusPublished - 2004
EventA comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles - Kanazawa, Japan
Duration: 1 Jan 2004 → …

Conference

ConferenceA comparison of secondary and backscattered electron image resolution in ultra low voltage (ULV) and variable pressure (VP) scanning electron microscopy data using Pt nanoparticles
Period1/01/04 → …

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