A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The a-AI2O3 Case.

V.A. Streltsov, P.N.H. Nakashima, Andrew Johnson

Research output: Contribution to journalArticle

14 Citations (Scopus)
Original languageEnglish
Pages (from-to)419-427
JournalMicroscopy and Microanalysis
Volume9
Issue number5
DOIs
Publication statusPublished - 2003

Cite this