A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The a-AI2O3 Case.

V.A. Streltsov; P.N.H. Nakashima; Andrew Johnson

doi:10.1017/S1431927603030356

A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The a-AI2O3 Case.

V.A. Streltsov, P.N.H. Nakashima, Andrew Johnson

Centre for Microscopy, Characterisation & Analysis

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Original language	English
Pages (from-to)	419-427
Journal	Microscopy and Microanalysis
Volume	9
Issue number	5
DOIs	https://doi.org/10.1017/S1431927603030356
Publication status	Published - 2003

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10.1017/S1431927603030356

Cite this

@article{af220d55390b4afca958afeaac69f452,

title = "A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The a-AI2O3 Case.",

author = "V.A. Streltsov and P.N.H. Nakashima and Andrew Johnson",

year = "2003",

doi = "10.1017/S1431927603030356",

language = "English",

volume = "9",

pages = "419--427",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "5",

}

TY - JOUR

T1 - A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The a-AI2O3 Case.

AU - Streltsov, V.A.

AU - Nakashima, P.N.H.

AU - Johnson, Andrew

PY - 2003

Y1 - 2003

U2 - 10.1017/S1431927603030356

DO - 10.1017/S1431927603030356

M3 - Article

SN - 1431-9276

VL - 9

SP - 419

EP - 427

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 5

ER -