A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture

X. Zhao; S. Chen; Farid Boussaid; A. Bermak

A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture

X. Zhao, S. Chen, Farid Boussaid, A. Bermak

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	2007 IEEE International Symposium on Integrated Circuits
Place of Publication	United States of America
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	333-336
Volume	CD Rom
Edition	Singapore
ISBN (Print)	1424407974
Publication status	Published - 2007
Event	A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture - Singapore Duration: 1 Jan 2007 → …

Conference

Conference	A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture
Period	1/01/07 → …

Cite this

@inproceedings{e81e2e1645a34b7bb7c818a33f074d3b,

title = "A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture",

author = "X. Zhao and S. Chen and Farid Boussaid and A. Bermak",

year = "2007",

language = "English",

isbn = "1424407974",

volume = "CD Rom",

pages = "333--336",

booktitle = "2007 IEEE International Symposium on Integrated Circuits",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Singapore",

note = "A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture ; Conference date: 01-01-2007",

}

Zhao, X, Chen, S, Boussaid, F & Bermak, A 2007, A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture. in 2007 IEEE International Symposium on Integrated Circuits. Singapore edn, vol. CD Rom, IEEE, Institute of Electrical and Electronics Engineers, United States of America, pp. 333-336, A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture, 1/01/07.

A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture. / Zhao, X.; Chen, S.; Boussaid, Farid et al.

2007 IEEE International Symposium on Integrated Circuits. Vol. CD Rom Singapore. ed. United States of America : IEEE, Institute of Electrical and Electronics Engineers, 2007. p. 333-336.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture

AU - Zhao, X.

AU - Chen, S.

AU - Boussaid, Farid

AU - Bermak, A.

PY - 2007

Y1 - 2007

M3 - Conference paper

SN - 1424407974

VL - CD Rom

SP - 333

EP - 336

BT - 2007 IEEE International Symposium on Integrated Circuits

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States of America

T2 - A 0.18µm CMOS On-Chip Skin Detection Scheme based on NPNP-Triple-Junction Stucture

Y2 - 1 January 2007

ER -