Nikon TiE inverted epifluorescence microscope and components.
- Rigby, Paul (Chief Investigator)
- Sampson, David, (Chief Investigator)
- Zeps, Nikolajs, (Chief Investigator)
- Leedman, Peter (Chief Investigator)
- Robinson, Bruce (Chief Investigator)
- Yeoh, George (Chief Investigator)