Nikon TiE inverted epifluorescence microscope and components.
- Rigby, Paul (Chief Investigator)
- Sampson, David (Investigator 02)
- Zeps, Nikolajs (Investigator 03)
- Leedman, Peter (Investigator 04)
- Robinson, Bruce (Investigator 05)
- Yeoh, George (Investigator 06)