Comprehensive Analysis Facility for Thin Films and Surfaces
- Williams, James (Chief Investigator)
- Samarin, Sergey (Chief Investigator)
- Mitchell, Aman (Chief Investigator)
- Austin, Michael (Chief Investigator)
- Bilek, Marcela (Chief Investigator)
- Ling, Christopher (Chief Investigator)
- Munroe, Paul (Chief Investigator)
- Stevens-Kalceff, Marion (Chief Investigator)
- Riley, Daniel (Chief Investigator)
- Holland, Anthony (Chief Investigator)
- Kennedy, Brendan (Chief Investigator)
- Hoffman, Mark (Chief Investigator)
- Valanoor, Nagarajan (Chief Investigator)
- McCulloch, Dougal (Chief Investigator)
- Green, Martin (Chief Investigator)
- Kepert, Cameron (Chief Investigator)
- Kalantar-zadeh, Kourosh (Chief Investigator)
- Maschmeyer, Thomas (Chief Investigator)
- Conibeer, Gavin (Chief Investigator)
- Gross, Karlis (Chief Investigator)
- Burford, Robert (Chief Investigator)
- McKenzie, David (Chief Investigator)