Zeiss Versa 520 X-ray microscope (XRM)

X-ray micro-CT is a non-destructive imaging technique that produces 3D data sets from a range of samples types. It is an extension of 2D radiography (similar to having an X-ray taken of a broken bone), where the sample is imaged from multiple angles to ultimately produce a 3D reconstruction. The Versa 520 XRM instrument has the following capabilities:

Imaging modes: X-ray Absorption, Phase Contrast, Dual Energy
Stitching modes: Widefield, vertical stitching, combined widefield and vertical stitching.
Beam energy: 30-140kV
Pixel resolution range: 0.7 – 40 micrometre (sample and field of view dependent)
Optimal sample size range: 0.5 – 40 mm
Optical magnification: 0.4X, 4X, 20X and 40X
Camera: 2K X 2K (binning options 1, 2, 4 and 8)
File format outputs: .txm, DICOM, .tiff

Note: For publication purposes – scan specific imaging parameters should be stated to ensure reproducibility.

To cite this equipment/component: Centre for Microscopy, Characterisation & Analysis. (2018). Zeiss Versa 520 X-ray microscope (XRM). University of Western Australia. https://doi.org/10.26182/T1Y3-EE81