WITEC alpha 300RA+

    Facility/equipment: Equipment

    • Location

      CMCA@Physics, Physics Building, University of Western Australia, 35 Stirling Highway Perth WA 6009

      Australia

    Description

    The WITec alpha 300RA+ features scanning probe as well as high-resolution optical and Raman microscopy techniques in a single instrument.

    The confocal Raman imaging system offers the unique ability to acquire chemical information non-destructively with a resolution down to the optical diffraction limit (~200 nm). This allows the analysis of the distribution of different phases within a sample in ambient conditions without specialised sample preparation. Because of the confocal setup, it is not only possible to collect information from the sample surface, but also to look deep inside transparent samples and even obtain 3D information.

    The system integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavours.

    TrueSurface Microscopy allows confocal Raman imaging along heavily inclined or very rough samples with the surface held in constant focus while maintaining the highest confocality. It is thereby possible to perform confocal imaging measurements parallel with and guided by a large area topographic scan.

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    atomic force microscopy
    microscopy
    high resolution
    versatility
    optical microscopes
    positioning
    grade
    alignment
    inclusions
    preparation
    scanning
    composite materials
    probes
    diffraction

    Research technique

    • Atomic force microscopy (AFM)
    • Confocal Raman imaging
    • Confocal Raman spectroscopy
    • Combined AFM and RAMAN measurements