Equipments Details
Description
The Dimension 3000 Scanning Probe Microscope can operate as Atomic Force Microscope (AFM) to obtain three-dimensional images of sample surfaces on the nano-scale.
Measurements can be performed in air and in-situ, allowing the investigation of the topography of a large variety of samples, ranging from hard samples (crystals, metals, etc.) to soft samples (polymers, gels, bacteria, etc.). Using Magnetic Force Microscopy (MFM), the system also can acquire simultaneously magnetic and topography information of a sample. Apart from imaging, the interaction force between a sample and a probe can be monitored with AFM Force Spectroscopy measurements.
To cite this equipment/component: Centre for Microscopy, Characterisation & Analysis. (2018). VEECO Dimension 3000. University of Western Australia. https://doi.org/10.26182/7NSJ-A049
Measurements can be performed in air and in-situ, allowing the investigation of the topography of a large variety of samples, ranging from hard samples (crystals, metals, etc.) to soft samples (polymers, gels, bacteria, etc.). Using Magnetic Force Microscopy (MFM), the system also can acquire simultaneously magnetic and topography information of a sample. Apart from imaging, the interaction force between a sample and a probe can be monitored with AFM Force Spectroscopy measurements.
To cite this equipment/component: Centre for Microscopy, Characterisation & Analysis. (2018). VEECO Dimension 3000. University of Western Australia. https://doi.org/10.26182/7NSJ-A049
Details
| Name | Decommissioned |
|---|---|
| Decommission date | 1/01/22 |
Research technique
- Atomic force microscopy (AFM)
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