Equipments Details
Description
The Dimension 3000 Scanning Probe Microscope can operate as Atomic Force Microscope (AFM) to obtain three-dimensional images of sample surfaces on the nano-scale.
Measurements can be performed in air and in-situ, allowing the investigation of the topography of a large variety of samples, ranging from hard samples (crystals, metals, etc.) to soft samples (polymers, gels, bacteria, etc.). Using Magnetic Force Microscopy (MFM), the system also can acquire simultaneously magnetic and topography information of a sample. Apart from imaging, the interaction force between a sample and a probe can be monitored with AFM Force Spectroscopy measurements.
Measurements can be performed in air and in-situ, allowing the investigation of the topography of a large variety of samples, ranging from hard samples (crystals, metals, etc.) to soft samples (polymers, gels, bacteria, etc.). Using Magnetic Force Microscopy (MFM), the system also can acquire simultaneously magnetic and topography information of a sample. Apart from imaging, the interaction force between a sample and a probe can be monitored with AFM Force Spectroscopy measurements.
Research technique
- Atomic force microscopy (AFM)
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.