VEECO Dimension 3000

    Facility/equipment: Equipment

    • Location

      CMCA@Physics, Physics Building, University of Western Australia, 35 Stirling Highway Perth WA 6009

      Australia

    Description

    The Dimension 3000 Scanning Probe Microscope can operate as Atomic Force Microscope (AFM) to obtain three-dimensional images of sample surfaces on the nano-scale.

    Measurements can be performed in air and in-situ, allowing the investigation of the topography of a large variety of samples, ranging from hard samples (crystals, metals, etc.) to soft samples (polymers, gels, bacteria, etc.). Using Magnetic Force Microscopy (MFM), the system also can acquire simultaneously magnetic and topography information of a sample. Apart from imaging, the interaction force between a sample and a probe can be monitored with AFM Force Spectroscopy measurements.

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    microscopes
    topography
    metal crystals
    magnetic force microscopy
    probes
    bacteria
    gels
    scanning
    air
    polymers
    spectroscopy
    interactions

    Research technique

    • Atomic force microscopy (AFM)