The coaxial lens design allows the primary beam to be focused to sub-50 nm for Cs+ and O- primary ions.
The NanoSIMS 50L uses a rastered ion beam to scan across the sample surface. Secondary ions are sputtered from the sample and extracted to a double-focusing magnetic-sector mass spectrometer. Multiple detectors allow the parallel mapping of up to seven ion species, simultaneously.
The high-resolution ion-imaging capability is a powerful and unique feature of the NanoSIMS 50L, and is highly suitable for elemental or isotopic mapping at the sub-µm scale. This is a particularly powerful technique for mapping the distribution of isotopic tracers (for example, 15N or 13C in biological experiments). Isotopic ratios can be determined with a precision of one per cent in favourable cases.
- Trace element mapping at sub-µm scale
- In situ isotope measurements at µm scale
- Depth profiling
- 3D volumetric imaging