NanoSIMS 50L

    Facility/equipment: Equipment

    • Location

      CMCA@Physics, Physics Building, University of Western Australia, 35 Stirling Highway Perth WA 6009



    The coaxial lens design allows the primary beam to be focused to sub-50 nm for Cs+ and O- primary ions.

    The NanoSIMS 50L uses a rastered ion beam to scan across the sample surface. Secondary ions are sputtered from the sample and extracted to a double-focusing magnetic-sector mass spectrometer. Multiple detectors allow the parallel mapping of up to seven ion species, simultaneously.

    The high-resolution ion-imaging capability is a powerful and unique feature of the NanoSIMS 50L, and is highly suitable for elemental or isotopic mapping at the sub-┬Ám scale. This is a particularly powerful technique for mapping the distribution of isotopic tracers (for example, 15N or 13C in biological experiments). Isotopic ratios can be determined with a precision of one per cent in favourable cases.


    Mass spectrometers
    Ion beams
    Imaging techniques