Description
The CAMECA NanoSIMS 50 is a new generation ion-microprobe which combines high-lateral and spectral resolution together with high sensitivity.
The coaxial lens design allows the primary beam to be focused to sub-50 nm for Cs+ primary ions and sub-150 nm for O- primary ions. The NanoSIMS 50 uses a rastered ion beam to scan across the sample surface. Secondary ions are sputtered from the sample and extracted to a double-focusing magnetic-sector mass spectrometer. Multiple detectors allow the parallel mapping of up to five ion species, simultaneously.
The high-resolution ion-imaging capability is a powerful and unique feature of the NanoSIMS 50, and is highly suitable for elemental or isotopic mapping at the sub-µm scale. This is a particularly powerful technique for mapping the distribution of isotopic tracers (for example. 15N or 13C in biological experiments). Isotopic ratios can be determined with a precision of one per cent in favourable cases.
The coaxial lens design allows the primary beam to be focused to sub-50 nm for Cs+ primary ions and sub-150 nm for O- primary ions. The NanoSIMS 50 uses a rastered ion beam to scan across the sample surface. Secondary ions are sputtered from the sample and extracted to a double-focusing magnetic-sector mass spectrometer. Multiple detectors allow the parallel mapping of up to five ion species, simultaneously.
The high-resolution ion-imaging capability is a powerful and unique feature of the NanoSIMS 50, and is highly suitable for elemental or isotopic mapping at the sub-µm scale. This is a particularly powerful technique for mapping the distribution of isotopic tracers (for example. 15N or 13C in biological experiments). Isotopic ratios can be determined with a precision of one per cent in favourable cases.
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Ions
Spectral resolution
Mass spectrometers
Ion beams
Lenses
Detectors
Imaging techniques
Experiments