The Keysight Scanning Probe Microscope (SPM) is a multi-functional research system for atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), providing atomic scale resolution 3-dimensional imaging of surfaces. The instrument is well suited for applications in materials science, life science, polymer science, geology, chemistry, and surface & interface science. The Keysight 5500SPM facilitates 3-dimensional imaging of a sample allowing visualisation and precise measurements of surface features, roughness analysis, film thickness measurements, in situ monitoring of growth or dissolution processes, temperature and environmental control. The system’s dedicated STM capabilities are designed for STM IV and STM break junction experiments to investigate the electrical conductance of individual molecules.
Scanning tunneling microscopy
Atomic force microscopy
- Atomic force microscopy (AFM)