FEI Titan G2 80-200 TEM/STEM

The Titan G2 80-200 TEM/STEM is capable of imaging at atomic resolution in both conventional and scanning transmission electron microscopy (STEM) modes, the microscope is optimised for high-performance microanalysis by energy-dispersive X-ray spectroscopy (EDX) and electron energy-loss spectroscopy (EELS). The Titan is equipped with a CCD camera and a set of STEM detectors for brightfield, darkfield and high angle annular dark field STEM imaging. Three-dimensional imaging is also possible using FEI's Xplore3D tomography package for automated acquisition, reconstruction and visualisation of tomographic data.

The microscope is equipped with FEI’s ChemiSTEM Technology, which consists of the FEI proprietary X-FEG high brightness Schottky field emission source, the patented Super-X 4-SDD, windowless EDX detector system, and fast mapping electronics capable of 100,000 spectra/second in EDX spectrum imaging.

This facility was funded through the Australian Research Council (LIEF grant LE130100030), with support from UWA, Curtin, Murdoch, ECU and CSIRO.

Techniques

- Brightfield and darkfield imaging
- Electron diffraction (selected area, microbeam and convergent beam)
- High resolution TEM
- Scanning transmission electron microscopy (STEM), including brightfield (BF), darkfield (DF) and high angle annular dark field (HAADF) modes
- Energy-dispersive X-ray spectroscopy (EDX) – point mode and mapping
- Electron energy-loss spectroscopy (EELS) – point mode and mapping
- Electron tomography using both conventional imaging and STEM imaging modes