Equipments Details
Description
The JEOL JXA-8530F field-emission electron probe microanalyser (FE-EPMA) is capable of quantitative microanalysis and high-resolution electron imaging. The instrument is equipped with five wavelength-dispersive spectrometers (WDS) fitted with LDE1, LDE2, LDEB, PETJ and LiF crystals, including high-sensitivity PETH and LiFH variants, an energy-dispersive spectrometer (EDS), and detectors for secondary electron (SE) and backscattered electron (BSE) imaging. It supports point analyses and line traverses of major, minor, and trace elements down to a few tens of ppm, and elemental mapping down to a few hundreds to few thousands of ppm.
To cite this equipment/component: Research Infrastructure Platforms. (2018). Electron Microscopy JEOL 8530F microprobe. University of Western Australia. https://doi.org/10.26182/MBDW-Q477
To cite this equipment/component: Research Infrastructure Platforms. (2018). Electron Microscopy JEOL 8530F microprobe. University of Western Australia. https://doi.org/10.26182/MBDW-Q477
Research technique
- Secondary electron (SE) imaging
- Wavelength-Dispersive X-ray Spectroscopy (WDS)
- Quantitative Element Mapping
- Backscattered Electron (BSE) imaging
- Energy-Dispersive X-ray Spectroscopy (EDX/EDS/EDXS)
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