The Titan G2 80-200 Transmission Electron Microscope (TEM) operates from 80-200 kV and is capable of imaging from the micro-scale to atomic scale in both conventional and scanning transmission electron microscopy (STEM) modes. The microscope is optimised for nanoscale elemental and chemical analysis by energy-dispersive X-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS). The microscope is equipped with a CCD camera and a set of STEM detectors for bright field (BF), dark field (DF) and high angle annular dark field (HAADF) STEM imaging. Three-dimensional imaging is also possible using electron tomography.
To cite this equipment/component: Research Infrastructure Platforms. (2018). Electron Microscopy FEI Titan TEM. University of Western Australia. https://doi.org/10.26182/M70T-GB34
- High Resolution Transmission Electron Microscopy (HRTEM)
- Scanning Transmission Electron Microscopy (STEM)
- Brightfield imaging
- Electron diffraction
- Electron Energy-Loss Spectroscopy (EELS)
- Dark Field Imaging
- Electron tomography
- Energy-Dispersive X-ray Spectroscopy (EDX/EDS/EDXS)
- High Angle Annular Dark Field STEM imaging (HAADF)